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Software Reliability Growth Models with Exponentiated Weibull Testing-effort function and Analyzing its Release Policy

Shaik. Mohammad Rafi, Dr.K. Nageswaran Rao, Dr.S. Pallam Sety, Shaheda Akthar

Abstract


Software reliability is one of the important factors of software quality. Before software delivered in to market it is thoroughly checked and errors are removed. Every software industry wants to develop software that should be error free. Software reliability growth models are helping the software industries to develop software which is error free and reliable. In this paper an analysis is done based on incorporating the Exponentiated Weibull testing-effort in to NHPP Software reliability growth model and also observed its release policy. Experiments are performed on the real datasets. Parameters are calculated and observed that our model is best fitted for the datasets.

Keywords


Software Reliability, Software Testing, Testing Effort, Non-homogeneous Poisson Process (NHPP), Software Cost.

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References


A.L. Goel and K. Okumoto, A time dependent error detection rate model for a large scale software system, Proc. 3rd USA-Japan Computer Conference, pp. 3540, San Francisco, CA (1978).

A.Wood, Predicting software reliability, IEEE computers 11 (1996) 69–77.

Bokhari, M.U. and Ahmad, N. (2005), “Software reliability growth modeling for exponentiated Weibull functions with actual software failures data”, in Proceedings of 3rd International Conference on Innovative Applications of Information Technology for Developing World (AACC’2005), Nepal.

Bokhari, M.U. and Ahmad, N. (2006), “Analysis of a software reliability growth models: the case of log-logistic test-effort function”, in Proceedings of the 17th International Conference on Modelling and Simulation (MS’2006), Montreal, Canada, pp. 540-5.

C.-Y. Huang, S.-Y. Kuo, J.Y. Chen, Analysis of a software reliability growth model with logistic testing effort function proceeding of Eighth International Symposium on Software Reliability Engineering, 1997, pp. 378–388.

Goel, A.L., "Software reliability models: Assumptions, limitations, and applicability", IEEE Transactions on Software Engineering SE-11 (1985) 1411-1423.

Huang, C.Y. and Kuo, S.Y. (2002), “Analysis of incorporating logistic testing-effort function into software reliability modeling”, IEEE Transactions on Reliability, Vol. 51 No. 3, pp. 261-70.

Huang, C.Y., Kuo, S.Y. and Chen, I.Y. (1997), “Analysis of software reliability growth model with logistic testing-effort function”, in Proceeding of 8th International Symposium on Software Reliability Engineering (ISSRE’1997), Albuquerque, New Mexico, pp. 378-88.

Huang, C.Y., Kuo, S.Y. and Lyu, M.R. (1999), “Optimal software release policy based on cost, reliability and testing efficiency”, in Proceedings of the 23rd IEEE Annual International

Huang, C.Y., Kuo, S.Y. and Lyu, M.R. (2000), “Effort-index based software reliability growth models and performance assessment”, in Proceedings of the 24th IEEE Annual International Computer Software and Applications Conference (COMPSAC’2000), pp. 454-9.

Huang, Lyu and Kuo “An Assesment of testing effort dependent software reliability Growth model”. IEEE transactions on Reliability Vol 56, No: 2, June 2007

Huang and S. Y. Kuo, “Analysis and assessment of incorporating logistic testing effort function into software reliability modeling,” IEEE Trans. Reliability, vol. 51, no. 3, pp. 261–270, Sept. 2002.

K. Pillai and V. S. Sukumaran Nair, “A model for software development effort and cost estimation,” IEEE Trans. Software Engineering, vol. 23, no. 8, August 1997.

K. Srinivasan and D. Fisher, “Machine learning approaches to estimating software development effort,” IEEE Trans. Software Engineering, vol. 21, no. 2, pp. 126–136, 1995.

M. Ohba, Software reliability analysis models, IBM J. Res. Dev. 28 (1984) 428–443.

M.R. Lyu, Handbook of Software Reliability Engineering, Mcgraw Hill, 1996.

Pham, H. (2000), Software Reliability, Springer-Verlag, New York, NY.

Quadri, S.M.K., Ahmad, N., Peer, M.A. and Kumar, M. (2006), “Nonhomogeneous Poisson process software reliability growth model with generalized exponential testing effort function”, RAU Journal of Research, Vol. 16 Nos 1-2, pp. 159-63.

Rameshwar D. Gupta and Debasis Kundu “generalized exponential distribution: different method of estimations” j. statist. comput. simul., 2000, vol. 00, pp. 1 – 22 14 november 2000.

S. Yamada, H. Ohtera and R. Narihisa, "Software Reliability Growth Models with Testing-Effort," IEEE Trans. Reliability, Vol. R-35, pp. 19-23 (1986).

S. Yamada, H. Ohtera, Software reliability growth model for testing effort control, Eur. J. Oper. Res. 46 (1990) 343–349.

S.Yamada, S.Osaki, "Software reliability growth modeling: models and applications", IEEE Trans. Software Engineering, vol.l I, no.12, p.1431-1437, December 1985.

Xie, M. (1991), Software Reliability Modeling, World Scientific Publication, Singapore.

Yamada, S., Ohba, M., Osaki, S., 1983. S-shaped reliability growth modeling for software error detection. IEEE Trans. Reliab. 12, 475–484.

Yamada, S. and Osaki, S. (1985b), “Cost-reliability optimal release policies for software systems”, IEEE Transactions on Reliability, Vol. R-34 No. 5, pp. 422-4.

J.D. Musa, A. Iannino, and K. Okumoto, Software Reliability: Measurement, Prediction, Application, McGraw-Hill NewYork, 1987.

Y. Lan, and L. Leemis, (Aug. 2007) “The Logistic-Exponential Survival Distribution,” Naval Research Logistics (NRL) volume 55, number 3, pp. 252-264.

G.S. Mudholkar and D.K Srivastava (1993):” Exponentiated Weibull Family For Analyzing Bathtub Failure-Rate Data” IEEE Transactions on Reliability, Vol.42 No.2, 1993 june.

M.pal, M.M Ali and J.Woo “Exponentiated Weibull Distribution” Statistica Anno LXVI,Vno 2, 2006.

S.K Ashour and W.M.Afify “Statistical Analysis of Exponentiated Weibull Family under Type I progressive Interval Cencering with Random removals” Journal of Applied Science Research 3(12), 2007.


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