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Exploiting of Way Tag Information to Improve Energy-Efficient in L2 Cache Architecture

A. Yogashanmugam, R.S. Kamala Kannan

Abstract


Caches are the main structures in modern microprocessors but they are harmed to the transient errors. Implementing same tag bits to increase error protection capability of the tag bits in the caches. When data are access from the main memory, then it checks if equivalent cache lines also contain the same tag bits of the data fetched, these same tag bit value is stored in the sti location. When an error is identified in the tag bits, the same tag bit information is used to replace the error in the tag bits. In this project, proposed a way-tagged cache to increase the energy efficiency of write-through caches. The way tags technique of L2 cache in L1 cache through read operations the way tag will enables the L2 cache to process in an corresponding manner during write hits, which access for the most of L2 cache accesses. This will leads to energy reduction in cache architecture without performance degradation. Future work is directed towards this technique to extending other levels of cache hierarchy and improve the energy consumption of other cache operations.


Keywords


Cache, Low Power, Memory Mapping, Write-Through Policy.

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References


Jeongkyu Hong, Jesung Kim, and Soontae Kim, “Exploiting Same Tag Bits to Improve the Reliability of the Cache Memories” Ieee Transactions On Very Large Scale Integration (Vlsi) Systems Vol.23 , Issue 2,PP.254- 265 Feb. 2014

Bhattacharya k. Ranganathan N. and Kim S. (2009), “A framework for correction of multi-bit soft errors in L2 caches based on redundancy,” IEEE Trans. Very Large Scale Integr. (VLSI) Syst. vol. 17, no. 2,pp. 196–206.

S. Segars, “Low power design techniques for microprocessors,” in Proc. Int. Solid-State Circuits Conf. Tutorial, 2001, pp. 268–273.

A. Malik, B. Moyer, and D. Cermak, “A low power unified cache architecture providing power and performance flexibility,” in Proc. Int.Symp. Low Power Electron. Design, 2000, pp. 241–243.

D. Brooks, V. Tiwari, and M. Martonosi, “Wattch: A framework for architectural-level power analysis and optimizations,” in Proc. Int. Symp.Comput. Arch., 2000, pp. 83–94.

Henning J. (2005),“SPEC CPU2006 benchmark descriptions,” ACM SIGARCH Comput. Archit. News, vol. 34, no. 4, pp. 1–17.

J. Maiz, S. hareland, K. Zhang, and P.Armstrong, “Characterization of multi-bit soft error events in advanced SRAMs,” in Proc. Int. Electron Devices Meeting, 2003, pp. 21.4.1–21.4.4.

K. Osada, K. Yamaguchi, and Y. Saitoh, “SRAM immunity to cosmic-ray-induced multierrors based on analysis of an induced parasitic bipolar effect,” IEEE J. Solid-State Circuits, pp. 827–833,2004.

F. X. Ruckerbauer and G. Georgakos, “Soft error rates in 65 nm SRAMs: Analysis of new phenomena,” in Proc. IEEE Int. On-Line Test. Symp., 2007, pp. 203–204.

C. Zhang, F. Vahid, and W. Najjar, “A highly- configurable cache architecturefor embedded systems,” in Proc. Int. Symp. Comput. Arch.,2003, pp. 136–146.

R. Kessler, “The alpha 21264 microprocessor,” IEEE Micro, vol. 19,no. 2, pp. 24–36, Apr. 1999.

P. Shivakumar, “Modeling the effect of technology trends on the soft error rate of combinational logic,” in Proc. Int. Conf. Dependable Syst. Netw., 2002, pp. 389–398

J. Dai and L. Wang, “Way-tagged cache: An energy efficient L2 cache architecture under write through policy,” in Proc. Int. Symp. Low Power Electron. Design, 2009, pp. 159–164.

Zhang W and Gurumurth S ( 2003), “ICR: In-cache replication for enhancing data cache reliability,” in Proc. Int. Conf. Dependable. Syst. Netw., pp. 291–300.


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